Method and apparatus for detecting abnormal characteristic...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Reexamination Certificate

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07636609

ABSTRACT:
In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least a last one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive-decrease or increase tendency has occurred and the last characteristic value is located within the control region outside the normal region, an alarm state is detected.

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patent: 2001-67109 (2001-03-01), None
United States Office Action dated Oct. 28, 2008 in U.S. Appl. No. 11/378,297.

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