Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2007-12-20
2011-12-06
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
C382S115000
Reexamination Certificate
active
08072612
ABSTRACT:
A method includes detecting a feature of an input pattern using a plurality of feature detectors, selecting at least one of the feature detectors based on their output values, and calculating a feature quantity of the input pattern based on an output value from at least one selected feature detector.
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Matsugu Masakazu
Mitarai Yusuke
Mori Katsuhiko
Sato Hiroshi
Torii Kan
Canon Kabushiki Kaisha
Chowdhury Tarifur
Pajoohi Tara S
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