Image analysis – Pattern recognition – Feature extraction
Patent
1996-10-31
1999-08-17
Boudreau, Leo H.
Image analysis
Pattern recognition
Feature extraction
382179, 382181, 382182, 382190, 382192, 382199, 382200, 382224, 382259, G06K 946
Patent
active
059405350
ABSTRACT:
A design for a high reliability recognition system utilizes two optimized thresholds for each class k of a prototype data base. One threshold is a class region threshold CR.sub.k and the other is a dis-ambiguity threshold DA.sub.k. CR.sub.k specifies a constrained region belonging to a class k, and DA.sub.k corresponds to a value with which a sample belonging to class k can be correctly recognized with a high level of confidence. During recognition, if the distance D(x, r.sub.M) between an input sample x and the representative prototype r.sub.M of a nearest class M is larger than the class region threshold CR.sub.M, x will be rejected. Furthermore, if the distance D(x, r.sub.M) is subtracted from the distance D(x, r.sub.S) between x and the representative prototype r.sub.S of a second nearest class S, the resulting distance difference must be greater than the dis-ambiguity threshold DA.sub.M, or x will be rejected. An inventive algorithm is used to compute optimum thresholds CR.sub.k and DA.sub.k for each class k. The algorithm is based on minimizing a cost function of a recognition error analysis. Experiments were performed to verify the feasibility and effectiveness of the inventive method.
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Boudreau Leo H.
Industrial Technology Research Institute
Patel Kanji
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