Method and apparatus for decomposing signal jitter using...

Details Method and apparatus for decomposing signal jitter using... Method and apparatus for decomposing signal jitter using...

2005-05-24

2005-05-24

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S077000, C324S620000, C375S226000

Reexamination Certificate

active

06898535

ABSTRACT:
A method and apparatus for analyzing jitter in a signal. The signal is buffered to form a sequence of signal vectors and a time interval error function is calculated for each the signal vector. A time interval error spectrum is then calculated by transforming the time interval error function using a discrete Fourier transform. An average time interval error spectrum and an average power spectral density function are then calculated as averages of the amplitude of the time interval error spectrum and its amplitude squared, respectively. Parameters of the signal jitter are estimated from the average time interval error spectrum and the average power spectral density function.

REFERENCES:
patent: 6137283 (2000-10-01), Williams et al.
patent: 20020120420 (2002-08-01), Wilstrup et al.
patent: 20030004664 (2003-01-01), Ward et al.
patent: 20040136450 (2004-07-01), Guenther

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