Method and apparatus for decomposing and verifying...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S057000, C702S087000

Reexamination Certificate

active

11118044

ABSTRACT:
The present invention includes a method and apparatus for decomposing and verifying configurable hardware. In one embodiment, the method includes automatically decomposing a set of one or more units at a first level of a configurable hardware system design hierarchy into a set of two or more units of a lower level of the hardware system design hierarchy. The set of one or more units at a first level includes one or more units dynamically instantiated at design creation time as well as at least a first unit composed of a previously instantiated hardware system composed with two or more levels of units within the hardware system design hierarchy of the previously instantiated hardware system.

REFERENCES:
patent: 5801956 (1998-09-01), Kawamura et al.
patent: 6701474 (2004-03-01), Cooke et al.
patent: 6816814 (2004-11-01), Ebert et al.
patent: 2002/0091979 (2002-07-01), Cooke et al.
patent: 2002/0161568 (2002-10-01), Sample et al.
patent: 2002/0171449 (2002-11-01), Shimizu et al.
patent: 2003/0067319 (2003-04-01), Cho
Thaker et al., “Register-Transfer Level Fault Modeling and Test Evaluation Techniques for VLSI Circuits”, ITC International Test Conference, 2000 IEEE, Paper 35.3, pp. 941-949.
VSI Alliance reference, “An Overview of VSIA” from http://www.vsi.org/aboutVSIA/index.htm, 2004, pp. 1 total.
Lin et al., “A Functional Test Planning System for Validation of DSP Circuits Modeled in VHDL”, 1998 International Verilog, pp. 172-177.
Evans et al., “Honey I Shrunk the SOC Verification Proablem”, Sonics, Inc., SNUG San Jose, 2001, 2001 pp. 11 total.
ALDEC, “What is TCL/TK Scripting?”, Jan. 2002, ALDEC Support, pp. 1-9.
PCT Notification of Transmittal of International Preliminary Examination Report for Int'l. Application No. PCT/US03/35336, Int'l Filing Date Nov. 5, 2003, mailed May 31, 2005, 5 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for decomposing and verifying... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for decomposing and verifying..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for decomposing and verifying... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3869809

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.