Method and apparatus for decoding wafer combination locks

Details Method and apparatus for decoding wafer combination locks Method and apparatus for decoding wafer combination locks

1983-05-31

1985-05-21

Smith, Gary L.

Geometrical instruments

Gauge

With support for gauged article

70394, G01B 520

Patent

active

045177465

ABSTRACT:
A probe for manually decoding a lock of the wafer combination type having an elongate body to slideably engage the keyway, the body comprising at least two hollow tubular members. Within the hollow members are rotatably disposed detecting members which detect, by means of physical contact, certain identifying portions of wafers therein which form the combination of the lock. An indicator on the outside of the probe, responsive to the detecting members, indicates the presence, type, and orientation of the wafers. The same method may be practiced without the use of the probe by viewing the interior of the lock slightly off center with a pencil beam of light to determine the same characteristic wafer portions.

REFERENCES:
patent: 1991151 (1935-02-01), Hansen
patent: 2087423 (1937-07-01), Abrams
patent: 2727312 (1955-12-01), Tampke
patent: 3087050 (1963-04-01), Rubens
patent: 3109243 (1963-11-01), McCormick

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