Method and apparatus for current and temperature measurement...

Details Method and apparatus for current and temperature measurement... Method and apparatus for current and temperature measurement...

2007-01-12

2009-06-16

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Temperature

C702S104000, C702S105000, C702S117000, C324S765010

Reexamination Certificate

active

07548825

ABSTRACT:
A current/temperature measurement method using parasitic components in an electronic power circuit is disclosed. The measured values derived from these parasitic components with inadequate precision are first of all compensated for, in terms of their current/temperature or voltage dependence, during the production process. The evaluation which takes place during operation involves compensating for the temperature or current dependence of the sensor components using two measurements which are linearly independent of one another and appropriate arithmetic operations in an evaluation unit.

REFERENCES:
patent: 5805131 (1998-09-01), Hartmann et al.
patent: 6022750 (2000-02-01), Akram et al.
patent: 6334093 (2001-12-01), More
patent: 2006/0086180 (2006-04-01), Kassner
patent: 2007/0234097 (2007-10-01), Nervegna

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