Method and apparatus for controlling the lapping of magnetic hea

Abrading – Precision device or process - or with condition responsive... – Computer controlled

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451 8, B24B 4904, B24B 4910

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active

057724938

ABSTRACT:
The invention is directed toward a lapping apparatus and method for accurately obtaining the height of a magnetoresistive (MR) element of a magnetic head during a lapping process. The apparatus includes a source for inducing a magnetic excitation field, and a current source for applying a sense current to a prepatterned photolithographically formed MR element. A sensor monitors the resistance of the MR element in response to variations in the magnetic excitation field, and controls the lapping process in response to the monitored resistance of the MR element. In one embodiment, the MR element includes a GMR formed of a stack of parallel MR layers and operates either in a CPP (Current-Perpendicular-to-the Plane) mode or in a CIP (Current-In-the Plane) mode. In a particular embodiment, the magnetic excitation field is generated by a conductor formed on the magnetic head.

REFERENCES:
patent: 4912883 (1990-04-01), Chang et al.
patent: 4914868 (1990-04-01), Church et al.
patent: 5305559 (1994-04-01), Ogawa
patent: 5361547 (1994-11-01), Church et al.
patent: 5494473 (1996-02-01), Dupuis et al.

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