Method and apparatus for controlling electron beam motion...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C378S207000

Reexamination Certificate

active

10065700

ABSTRACT:
Certain embodiments relate to a method for calibrating an imaging system having an array of detector elements arranged with respect to a reference position and having an energy source moving in a pattern to irradiate the array of detector elements. The method includes initiating estimated detector positions for the array of detector elements and an estimated motion pattern for the energy source defined with respect to a reference position. The method also includes scanning a phantom having pins located at positions in the phantom. The method further includes calculating estimated pin positions, with respect to the reference position, based on at least one of the estimated detector positions and motion pattern and modifying at least one of the estimated detector positions and pin positions based on at least two of the estimated detector positions, motion pattern and pin positions. The method also includes determining variation in the motion pattern based on at least one of the estimated detector positions and pin positions and adjusting the motion pattern for the energy source based on the variation.

REFERENCES:
patent: 4130759 (1978-12-01), Haimson
patent: 4344183 (1982-08-01), Jacobson
patent: 4613754 (1986-09-01), Vinegar et al.
patent: 4631741 (1986-12-01), Rand et al.
patent: 4884293 (1989-11-01), Koyama
patent: 5159623 (1992-10-01), Niepel
patent: 5761268 (1998-06-01), Hell et al.
patent: 5923727 (1999-07-01), Navab
patent: 6050724 (2000-04-01), Schmitz et al.
patent: 7006594 (2006-02-01), Chell et al.
patent: 19926098 (2000-12-01), None
patent: 0874536 (1998-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for controlling electron beam motion... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for controlling electron beam motion..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for controlling electron beam motion... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3786998

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.