Method and apparatus for contacting the lead of an article

Details Method and apparatus for contacting the lead of an article Method and apparatus for contacting the lead of an article

1975-12-15

1978-01-10

Rolinec, Rudolph V.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

339 74R, 324158P, G01R 3102

Patent

active

040681700

ABSTRACT:
Leads of electronic components, such as dual-inline packages, are contacted for test purposes by opposed pairs of cantilever-spring contacts. The tips of each pair of contacts are offset with respect to each other when in position for testing so that they do not touch each other when a lead is absent. The opposed contacts provide equal forces on opposite sides of the leads, so that no lead support is required for testing, and also provide open circuits instead of shorted circuits when a lead is absent.

REFERENCES:
patent: 2711523 (1955-06-01), Willis
patent: 3573617 (1971-04-01), Randolf
patent: 3710303 (1973-01-01), Gallager, Jr.
patent: 3848221 (1974-11-01), Lee, Jr.
patent: 3945710 (1976-03-01), Gartland, Jr.
Split-Tip Probe for Terminal Resistance Measurements, R. M. Murcko IBM Tech Disc. Bulletin, vol. 14, No. 2, July, 1971, p. 479.

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