Method and apparatus for contact free measurement of...

Details Method and apparatus for contact free measurement of... Method and apparatus for contact free measurement of...

2006-08-08

2009-02-24

Lauchman, L. G (Department: 2877)

Optics: measuring and testing

Shape or surface configuration

C356S613000, C356S625000

Reexamination Certificate

active

07495777

ABSTRACT:
A method and apparatus is described for contact-free 3 dimensional-measuring of a moving object with periodic motion. The method and apparatus makes use of the projection of a defined intensity pattern onto the moving object and the recording and analysis of a reflected pattern from the object wherein the intensity pattern projection is synchronized to a characteristic periodic frequency period or sub-period of the moving object.

REFERENCES:
patent: 6611343 (2003-08-01), Frankowski
patent: 6817528 (2004-11-01), Chen
patent: 6909514 (2005-06-01), Nayebi
patent: 2002/0041368 (2002-04-01), Ota et al.
patent: 2003/0103216 (2003-06-01), Gomez et al.
patent: 11211443 (1999-06-01), None
Barrientos B, and Cywiak, M.; “Measurement of dynamic deformation using a superrimposed grating”. Revista Mexicana Fisica 50(1) 12-18.

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