Method and apparatus for constructing verification test sequence

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364488, G06F 1100

Patent

active

057967520

ABSTRACT:
Verification Test Sequences (43) (VTS) are constructed for use in testing conformance of a Machine-Under-Test (14) (MUT) with a Finite State Machine (33) (FSM) model.
The number of incoming and outgoing Test Subsequence (TS) graph (39) micro-edges are determined for each TS graph (39) vertex or Finite State Machine (33) state. An Augmented Graph (95) is created (40) by constructing Test Subsequence (TS) micro-edge bridging sequences between TS graph vertices with relatively more incoming micro-edges and vertices with relatively more outgoing micro-edges. The newly symmetric Augmented Graph (95) is Euler Toured (42), generating Verification Test Sequences (43), used to test a Machine-Under-Test (14) for conformance with the FSM model (33).

REFERENCES:
patent: 4692921 (1987-09-01), Dahbura et al.
patent: 4716564 (1987-12-01), Hung et al.
patent: 4991176 (1991-02-01), Dahbura et al.
patent: 5394347 (1995-02-01), Kita et al.
patent: 5418793 (1995-05-01), Chang et al.
patent: 5426651 (1995-06-01), Van de Burgt
patent: 5430736 (1995-07-01), Takeoka et al.
Horowitz et al., "Fundamental of Data Structures", 1976, 107-115, 126-129, 184-217.
Thomas H. Cormen et al., Introduction to Algorithms, 1985 MIT Press, Cambridge, Mass.
Alfred V. Aho, et al., An Optimization Technique for Protocol Conformance Test Generation . . . Protocol Specification Testing and Verification VIII, p. 75, IFIP 1988.
Anton Dahbura et al., An Optimal Test Sequence for the JTAG/IEEE P1149.1 Test Access Port Cntlr. IEEE Proceedings 1989 International Test Conference, pp. 55-62, 1989.
Xiao Sun et al., Protocol Conformance Testing by Discriminating UIO Sequences Protocol Specification Testing and Verification XI, p. 349, IFIP 1991.
Xiao Sun et al., On the Verificaiton and Validation of Protocols with High Fault Coverage Using UIO Seq IEEE, 1992.
Kwang-Ting Cheng et al., Automatic Functional Test Generation Using the Finite State Machine Model 30th ACM/IEEE Design Automation Conference, p. 86, 1993.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for constructing verification test sequence does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for constructing verification test sequence, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for constructing verification test sequence will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1122351

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.