Method and apparatus for constructing unique input/output sequen

Details Method and apparatus for constructing unique input/output sequen Method and apparatus for constructing unique input/output sequen

1995-03-13

1996-09-10

Beausoliel, Jr., Robert W.

Excavating

G06F 1100

Patent

active

055552706

ABSTRACT:
A measurement of the distinctness of Finite State Machine (FSM) (33) model state transitions can expedite identification of Unique Input/Output Sequences (UIO) (63). The Input/Output (I/O) sequences associated with FSM model (33) state transitions are compared. Each different I/O sequence is replaced by a different label so that transitions with the same I/O sequence have the same label and transitions with different I/O sequences have different labels. A transformation of the count of the number of times that each label is found in the FSM model, or a subset thereof, is determined, and assigned to each corresponding transition as a Distinctness Measurement (58). This Distinctness Measurement can be used to expedite a depth-first search for Unique Input/Output Sequences (63).

REFERENCES:
patent: 4692921 (1987-09-01), Dahbura et al.
patent: 4716564 (1987-12-01), Hung et al.
patent: 4991176 (1991-02-01), Dahbura et al.
patent: 5394347 (1995-02-01), Kita et al.
patent: 5418793 (1995-05-01), Chang et al.
patent: 5426651 (1995-06-01), Van de Burgt
patent: 5430736 (1995-07-01), Takeoka et al.
Thomas H. Cormen et al., Introduction to Algorithms, 1985 MIT Press, Cambridge, Mass.
Alfred V. Aho, et al., An Optimization Technique for Protocol Conformance Test Generation . . . Protocol Specification Testing and Verification VIII, p. 75, IFIP 1988.
Anton Dahbura et al., An Optimal Test Sequence for the JTAG/IEEE P1149.1 Test Access Port Cntlr. IEEE Proceedings 1989 International Test Conference, pp. 55-62, 1989.
Xiao Sun et al., Protocol Conformance Testing by Discriminating UIO Sequences Protocol Specification Testing and Verification XI, p. 349, IFIP 1991.
Xiao Sun et al., On the Verification and Validation of Protocols with High Fault Coverage Using UIO Seq IEEE, 1992.
Kwang-Ting Cheng et al., Automatic Functional Test Generation Using the Finite State Machine Model 30th ACM/IEEE Design Automation Conference, p. 86, 1993.

Affiliated with

Also associated with

Rating

Method and apparatus for constructing unique input/output sequen does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for constructing unique input/output sequen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for constructing unique input/output sequen will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1326672