Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2008-06-03
2008-06-03
Barlow, Jr., John E (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S069000, C702S106000, C375S226000, C370S503000, C331S002000, C331S011000
Reexamination Certificate
active
07383160
ABSTRACT:
A method a low cost and production-integrable technique for providing a signal diagram. The data signal is edge-detected and asynchronously sampled (or alternatively a clock signal is latched). The data signal or a second signal is compared to a settable threshold voltage and sampled. The edge and comparison data are folded according to a swept timebase to find a minimum jitter period. The crossing of the signal diagram edges is determined from a peak of a histogram of the folded edge data. A histogram of ratios of the sample values versus displacement from the position of the crossing location is generated for each threshold voltage. The technique is repeated over a range of settable threshold voltages. Then, the ratio counts are differentiated across the histograms with respect to threshold voltage, from which a signal diagram is populated.
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Cranford, Jr. Hayden C.
Gebara Fadi H.
Schaub Jeremy D.
Barlow Jr. John E
Harris Andrew M.
Harris Mitch
International Business Machines - Corporation
Salys Casimer K.
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