Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-08-08
2006-08-08
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S182000, C702S183000
Reexamination Certificate
active
07089139
ABSTRACT:
A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.
REFERENCES:
patent: 6915454 (2005-07-01), Moore et al.
patent: 2005/0086579 (2005-04-01), Leitner et al.
Loh Aik Koon
Low Chen Ni
Tan Tiam Hock
Wai Keen Fung
Whang Daniel Z.
Agilent Technologie,s Inc.
Hoff Marc S.
Suarez Felix
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