Method and apparatus for concealing errors which extend over sev

Details Method and apparatus for concealing errors which extend over sev Method and apparatus for concealing errors which extend over sev

1989-08-15

1990-07-10

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

358166, 358 21R, G06K 940

Patent

active

049411861

ABSTRACT:
A defect location signal such as has been used on television film scanners to show that presence of scratches or dust specks on the scanned film is utilized to show the horizontal extent as well as the position of a defect affecting successive pixels on a television line. Beginning at some point preceding the defects and ending at some time following the defect, the succession of undisturbed pixel values is time expanded with interpolation of pixel values to the extent necessary to bridge the entire defect region. The spacing between detected defects is measured to control the number of undisturbed pixels at each side of the defect that will be spread apart by interpolated values and likewise the ratio of interpolated values to undisturbed pixels in the expanded signal.

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