Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-05-23
2006-05-23
Chawan, Sheela (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S145000, C382S274000, C029S740000
Reexamination Certificate
active
07050623
ABSTRACT:
Adjustment of image pickup conditions through alternative selection of two cameras different in resolution, adjustment of image lightness of a to-be-recognized component based on component information of the component, and performing control allows an image of the component to be picked up by either one of the cameras under the image pickup conditions.
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Fukuda Shozo
Hachiya Eiichi
Kanetaka Iwao
Noudo Akira
Chawan Sheela
Wenderoth , Lind & Ponack, L.L.P.
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