Method and apparatus for compensating S-parameters of...

Details Method and apparatus for compensating S-parameters of... Method and apparatus for compensating S-parameters of...

2011-08-09

2011-08-09

Nghiem, Michael P (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S076000, C702S081000

Reexamination Certificate

active

07996169

ABSTRACT:
The invention related to a method and circuit that is used to compensate for S-parameters of a passive circuit which do not satisfy passivity. The method includes the following steps: (1) getting S-parameters which do not satisfy passivity, these S-parameters being composed of an S-parameter matrix S; (2) computing matrix [S×S′], wherein matrix S′ is a complex conjugate transposed matrix of the S-parameter matrix S; (3) computing the eigenvalues of the matrix [S×S′], and choosing an eigenvalue Ψ whose real part real(Ψ) is the biggest; (4) computing a compensating value ξ, the compensating value ξ being equal to real(Ψ)1/2×(1+ε), wherein the ε is a very small positive number; and (5) dividing each of the S-parameters by the compensating value ξ to get the compensated S-parameters.

REFERENCES:
patent: 4713778 (1987-12-01), Baker
patent: 4982164 (1991-01-01), Schiek et al.
patent: 6614237 (2003-09-01), Ademian et al.
patent: 6836743 (2004-12-01), Blackham et al.
patent: 6998833 (2006-02-01), Wang et al.
patent: 2003/0088394 (2003-05-01), Min et al.

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