Method and apparatus for compensating for different depths of su

Details Method and apparatus for compensating for different depths of su Method and apparatus for compensating for different depths of su

1985-02-15

1987-10-27

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324225, G01N 2790, G01R 3312

Patent

active

047032650

ABSTRACT:
A method for testing an electrically conductive test object with regard to an imperfection therein uses a transducer supplied with drive signals of two different frequencies so that via inductive coupling between the transducer and the test object, signal information is received from the transducer which can be processed to indicate the presence of an imperfection. The invention is characterized in that the transducer is designed and supplied with drive signals in such wise that the effect of the different depth penetration of currents induced in the test object at the two frequencies can be compensated for.

REFERENCES:
patent: 4237419 (1980-12-01), Tornblom et al.
patent: 4303885 (1981-12-01), Davis et al.
patent: 4326166 (1982-04-01), Pigeon et al.
patent: 4503392 (1985-03-01), Fastritsky et al.
Kiev Light Ind, "Double-Frequency Modulation Defectoscope . . . " Instrument, Measuring and Testing, p. 54, Derwent Abstract E9739E/17.

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