Method and apparatus for comparing a data set to a baseline...

Details Method and apparatus for comparing a data set to a baseline... Method and apparatus for comparing a data set to a baseline...

2007-05-08

2007-05-08

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C702S190000, C702S194000, C702S195000

Reexamination Certificate

active

11104646

ABSTRACT:
A method and system are disclosed for comparing a data set to a baseline value for use in data analysis of the data set having a plurality of data points, the method comprising providing the data set to be analyzed, locating potentially bad data points in at least a portion of the data set using an odd-man out recursive technique, preparing a baseline set by discarding the potentially bad data points from the at least a portion of the data set and calculating a baseline value from the baseline set.

REFERENCES:
patent: 4634110 (1987-01-01), Julich et al.
patent: 6027941 (2000-02-01), Jarvie et al.
patent: 6606693 (2003-08-01), Morris
patent: 6754569 (2004-06-01), Bechhoefer
patent: 2003/0109951 (2003-06-01), Hsiung et al.

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