Method and apparatus for combined glide and defect analysis

Details Method and apparatus for combined glide and defect analysis Method and apparatus for combined glide and defect analysis

1996-04-18

1998-08-11

Snow, Walter E.

Measuring and testing

Surface and cutting edge testing

Roughness

360103, 360137, G11B 560, G01B 528, G01B 1708

Patent

active

057929475

ABSTRACT:
A method and apparatus for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor for detecting defects on the surface of a magnetic disk. The sensor generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor processes the signal before it is received by a peak detecting circuit. The peak detecting circuit detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.

REFERENCES:
patent: 5256965 (1993-10-01), Nomura

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