Method and apparatus for closed loop testing of first and second

Details Method and apparatus for closed loop testing of first and second Method and apparatus for closed loop testing of first and second

1976-03-22

1977-08-02

Olms, Douglas W.

1791753R, H04B 346

Patent

active

040397513

ABSTRACT:
A method and apparatus are disclosed for closed loop testing of first and second modulators and demodulators from the modulated signal side of the first modulator and first demodulator. During ordinary communication, the first modulator and second demodulator are connected in series and the first demodulator and the second modulator are connected in series. In response to each test initiate signal, a loop is established between the second modulator and the second demodulator on their modulated signal side. Upon reception of some test initiate signals, a loop is established between the first modulator and first demodulator on their demodulated side and they are disconnected from the second demodulator and second modulator. Thus, the first modulator and demodulator can be tested from their modulated signal side when a loop is established between them; and the first and second modulators and demodulators can be tested when a loop is established between the second modulator and demodulator but not between the first modulator and demodulator.

REFERENCES:
patent: RE27864 (1974-01-01), Davis
patent: 2840797 (1958-06-01), Derr
patent: 2864942 (1958-12-01), Drake
patent: 2864943 (1958-12-01), Schultz
patent: 2871289 (1959-01-01), Cox et al.
patent: 3049692 (1962-08-01), Hunt
patent: 3508018 (1970-04-01), Orne
patent: 3622877 (1971-11-01), MacDavid et al.
patent: 3636280 (1972-01-01), Wetzel
patent: 3655915 (1972-04-01), Liberman et al.
patent: 3692939 (1972-09-01), Knight et al.
patent: 3743938 (1973-07-01), Davis
patent: 3769454 (1973-10-01), Liberman et al.
patent: 3952163 (1976-04-01), Couturier et al.
patent: 3956601 (1976-05-01), Harris et al.
Brochure on Sanders Modem Tester, Model 101.

Affiliated with

Also associated with

Rating

Method and apparatus for closed loop testing of first and second does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for closed loop testing of first and second, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for closed loop testing of first and second will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2300028