Semiconductor device manufacturing: process – Semiconductor substrate dicing – With attachment to temporary support or carrier
Patent
1997-06-04
1999-11-02
Warden, Jill
Semiconductor device manufacturing: process
Semiconductor substrate dicing
With attachment to temporary support or carrier
438973, 438974, H01L 2168
Patent
active
059769548
ABSTRACT:
The present invention relates to a method of cleaning wafers bonded on a fixing member in the form of an ingot, and then sliced by a wire saw from a direction perpendicular to the longitudinal dimension to form a row of wafers. The method includes: a cleaning process for cleaning the wafers bonded on the fixing member in the form of the row of wafers (workpiece W) by a cleaning mechanism; and a separating process includes: a softening step for softening an adhesive in a softening vessel; a first moving step for turning and moving a wafer in a planar direction using an end point of the glued portion of the wafer and the fixing member as the fulcrum; and a second moving step for further moving the wafer in a planar direction by a suction-cup rotary actuator to thereby bring the wafer out of the region of the row of wafers.
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patent: 5667423 (1997-09-01), Itoi
Kimura Shigeru
Kumabe Shigeo
Chaudhry Saeed
Mitsubishi Materials Corporation
Mitsubishi Materials Silicon Corporation
Warden Jill
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