Method and apparatus for circuit board testing with controlled b

Details Method and apparatus for circuit board testing with controlled b Method and apparatus for circuit board testing with controlled b

1989-08-29

1992-06-30

Atkinson, Charles E.

Excavating

371 221, G01R 3128

Patent

active

051270099

ABSTRACT:
An automated circuit board testing system, for performing in-circuit, functional or cluster tests, takes backdrive stress into account in selecting appropriate isolation methods for digital devices during the design of the test protocol. In other words, the design of the test includes an analysis of the circuit board and its components, and of the available methods to isolate the device- or function-under-test from the rest of the circuit board. The analysis includes a calculation of stress currents on upstream components resulting from backdriving, and a selection of methods from those available which will produce stress currents below a pre-selected level. In another aspect of the invention, the safe maximum run-time for the test using the available methods is computed.

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Mastrocola, Effective Utilization of In-Circuit Techniques when Testing Complex Digital Assemblies, Automated Testing & Test Measurement, '81 Conference, Weisbaden, Germany, Mar. 23-26, 1981, pp. 106-117.

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