Method and apparatus for chemical analysis of specimens

Details Method and apparatus for chemical analysis of specimens Method and apparatus for chemical analysis of specimens

1979-05-07

1981-03-24

Richman, Barry

Chemistry: physical processes

Physical processes

Crystallization

23232C, 364497, 422 80, G01N 3108, G06G 775, G01N 3112

Patent

active

042577721

ABSTRACT:
A method and apparatus are disclosed for chemical analysis of specimens in order to detect the presence and percentages of given chemical elements (C, N, H, S and O) therein. Said specimen is subjected to known chemical treatments in order to reveal said elements, which elements are detected and revealed as peaks of a curve traced by the apparatus, each peak corresponding to an analyzed and detected element.
The surface area of each element peak is then correlated with that of the other element peaks in order to obtain a series of ratios between said areas.
Such ratios are then compared, for each element pairs, with an experimentally determined graph which is valuable for each element pair in all specimens and gives a ratio between the numbers of atoms of said element pair, so that from said ratios between the numbers of atoms of all analyzed and detected elements, a reduced formula of the specimen composition may be obtained. When the specimen is weighed, besides said reduced formula, it is possible to statistically locate a probable composition for the residue of the specimen molecule.

REFERENCES:
patent: 3168378 (1965-02-01), Maresh et al.
patent: 3241922 (1966-03-01), Walisch
patent: 3518059 (1970-06-01), Levy
patent: 3732411 (1973-05-01), Galeene
patent: 3838969 (1974-10-01), Dugan
patent: 3861874 (1975-01-01), Krc
patent: 3880587 (1975-04-01), Szakasits et al.
patent: 4106908 (1978-08-01), Leplat-Gryspeerdt

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