Method and apparatus for characterizing the microwaviness of...

Details Method and apparatus for characterizing the microwaviness of... Method and apparatus for characterizing the microwaviness of...

2005-04-26

2005-04-26

Williams, Hezron (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

06883368

ABSTRACT:
The microwaviness (i.e., surface waviness for wavelengths on the order of the length of the transducing head) of a recording disk surface is measured during manufacture as a quality control process. Preferably, the disk is measured using an actuator-mounted thermal sensor, comprising an electrical resistance element driven with a constant current. At small distances, the disk surface acts as a heat sink and variation in this distance will be detected as a change in resistance of the sensor. Preferably the sensor is initially used to characterize the gross waviness of the surface, and the actuator then follows this gross waviness to measure surface variations in the microwaviness range.

REFERENCES:
patent: 4468136 (1984-08-01), Murphy et al.
patent: 5527110 (1996-06-01), Abraham et al.
patent: 5696383 (1997-12-01), Cheng
patent: 5739972 (1998-04-01), Smith et al.
patent: 5741070 (1998-04-01), Moslehi
patent: 5751510 (1998-05-01), Smith et al.
patent: 5808184 (1998-09-01), Boutaghou et al.
patent: 5872311 (1999-02-01), Schaenzer et al.
patent: 5901001 (1999-05-01), Meyer et al.
patent: 6071007 (2000-06-01), Schaenzer et al.
patent: 6195219 (2001-02-01), Smith
patent: 6196062 (2001-03-01), Wright et al.
patent: 6239936 (2001-05-01), Abraham et al.
patent: 6262572 (2001-07-01), Franco et al.
patent: 6494085 (2002-12-01), Wakefield et al.
patent: 6619105 (2003-09-01), Yao et al.
patent: 242597 (1987-10-01), None

Affiliated with

Also associated with

Rating

Method and apparatus for characterizing the microwaviness of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for characterizing the microwaviness of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for characterizing the microwaviness of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3393622