Method and apparatus for characterizing microscale...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen

Reexamination Certificate

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Reexamination Certificate

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08042405

ABSTRACT:
A method of predicting sheet formability at a microscale level includes the steps of providing a grid pattern on a test sheet, bulging the test sheet to a hemispherical shape until a crack is initiated on the surface of the test sheet, detecting the initiation of the crack, acquiring two images of the surface adjacent to the crack and calculating surface strains on the test sheet.

REFERENCES:
patent: 3715915 (1973-02-01), Williams
patent: 3763697 (1973-10-01), Sturm
patent: 3969928 (1976-07-01), Zarka
patent: 5483819 (1996-01-01), Barmore et al.
patent: 5539656 (1996-07-01), Annigeri et al.
patent: 5572896 (1996-11-01), Story
patent: 5645977 (1997-07-01), Wu et al.
patent: 5757473 (1998-05-01), Kanduth et al.
patent: 5866283 (1999-02-01), Zandbergen et al.
patent: 5999887 (1999-12-01), Giannakopoulos et al.
patent: 6134954 (2000-10-01), Suresh et al.
patent: 6188483 (2001-02-01), Ettemeyer
patent: 6267011 (2001-07-01), Kurtz et al.
patent: 6279404 (2001-08-01), Whelan et al.
patent: 6311135 (2001-10-01), Suresh et al.
patent: 6349588 (2002-02-01), Brown et al.
patent: 6431007 (2002-08-01), Roy
patent: 6520004 (2003-02-01), Lin
patent: 6549648 (2003-04-01), Rinn
patent: 6581446 (2003-06-01), Deneuville et al.
patent: 6613167 (2003-09-01), Magnusen et al.
patent: 6684167 (2004-01-01), Hamad et al.
patent: 6722245 (2004-04-01), Yasoda et al.
patent: 6779386 (2004-08-01), Neo et al.
patent: 6945097 (2005-09-01), Jardret et al.
patent: 6973838 (2005-12-01), Denis
patent: 7105358 (2006-09-01), Majumdar et al.
patent: 7165463 (2007-01-01), Liu et al.
patent: 2003/0182982 (2003-10-01), Simpson et al.
patent: 2004/0222518 (2004-11-01), Haba et al.
patent: 2005/0146708 (2005-07-01), Shi et al.
patent: 2005/0279729 (2005-12-01), Okulan et al.
patent: 2006/0094162 (2006-05-01), Yabushita et al.
patent: 2007/0012094 (2007-01-01), Degertekin et al.
patent: 2007/0148032 (2007-06-01), Aruga et al.
patent: 2184361 (2002-06-01), None
patent: WO9416307 (1994-07-01), None
patent: WO9506903 (1995-03-01), None
Shuaib, et al., Size Effects on Strain Limits of Thin CuZn30 Brass Sheets, ICOMM 2007, No. 9.

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