Method and apparatus for characterizing a differential circuit

Details Method and apparatus for characterizing a differential circuit Method and apparatus for characterizing a differential circuit

1994-07-05

1996-02-27

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324632, 324638, 324642, 379417, 379 3, 178 69C, 178 69B, G01R 2704

Patent

active

054951739

ABSTRACT:
A method and apparatus is provided for characterizing a differential circuit. A measurement system (200) is used to introduce input signals to the differential circuit and to measure corresponding output signals. Particularly, an input differential wave is introduced into the differential circuit (1010) while correspondingly measuring a differential output wave (1020) and a first common mode output wave (1030). Similarly, an input common mode wave is introduced (1040) while measuring a second differential output wave (1050) and a second common mode output wave (1060).

REFERENCES:
patent: 2691133 (1954-10-01), Woodward
patent: 4996488 (1991-02-01), Nave
Microwave Wafer Probing, by Dale E. Carlton, K. Reed Gleason and Eric Strid, Microwave Journal, Jan. 1984, pp. 121-129.
Shielded Coupled-Strip Transmission Line, by S. E. Cohn, IRE Transactions--Microwave Theory and Techniques, Oct. 1955, pp. 29-38.

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