Method and apparatus for characterizing a broad spectrum signal

Details Method and apparatus for characterizing a broad spectrum signal Method and apparatus for characterizing a broad spectrum signal

1986-09-02

1988-12-27

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

324 77B, G01R 2316

Patent

active

047943246

ABSTRACT:
A method for characterizing a broad spectrum signal provides improved performance on high-noise, sloped, high variation signals by calculating separate low and high frequency average signal levels and determining low and high frequency bandwidth limits referenced to the low and high frequency average signal levels respectively. The method may be practiced using a computer system interfaced to a programmable spectrum analyzer.

REFERENCES:
patent: 3510440 (1985-04-01), Ryder
patent: 3961255 (1976-06-01), Hekimian
patent: 3975678 (1976-08-01), Erickson
patent: 4142177 (1979-02-01), Davis
patent: 4156183 (1979-05-01), Schuon
patent: 4420699 (1983-12-01), Schmitt
patent: 4547726 (1985-10-01), Premerlani
patent: 4547727 (1985-10-01), Tsui et al.

Affiliated with

Also associated with

Rating

Method and apparatus for characterizing a broad spectrum signal does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for characterizing a broad spectrum signal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for characterizing a broad spectrum signal will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-869827