Method and apparatus for characterizing...

Optical: systems and elements – Optical modulator – Light wave temporal modulation

Reexamination Certificate

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C359S290000, C250S216000

Reexamination Certificate

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10875555

ABSTRACT:
The invention provides a method and apparatus for evaluating the quality of microelectromechanical devices having deformable and deflectable members using resonation techniques. Specifically, product quality characterized in terms of uniformity of the deformable and deflectable elements is inspected with an optical resonance mapping mechanism on a wafer-level.

REFERENCES:
patent: 5629790 (1997-05-01), Neukermans et al.
patent: 5661591 (1997-08-01), Lin et al.
patent: 5796508 (1998-08-01), Suzuki
patent: 5870176 (1999-02-01), Sweatt et al.
patent: 6052197 (2000-04-01), Drake
patent: 6088474 (2000-07-01), Dudasko et al.
patent: 6348907 (2002-02-01), Wood
patent: 6515278 (2003-02-01), Wine et al.
patent: 6566627 (2003-05-01), Brandinger et al.
patent: 6707351 (2004-03-01), Gorrell
patent: 6747783 (2004-06-01), Sandstrom
patent: 6751370 (2004-06-01), Avakian et al.
patent: 6798560 (2004-09-01), Aubuchon
patent: 6922233 (2005-07-01), Riza
patent: 6987599 (2006-01-01), Sandstrom
patent: 6998219 (2006-02-01), Fries
patent: 6998851 (2006-02-01), van Spengen
patent: 7019376 (2006-03-01), Patel et al.
patent: 7034984 (2006-04-01), Pan et al.
patent: 2003/0218753 (2003-11-01), Reuter
patent: 2003/0223084 (2003-12-01), Mehri et al.
patent: 2004/0042000 (2004-03-01), Mehri et al.
Henry Chu, et al., “DMD superstructure Characterizations”, Jul.-Sep. 1998, pp. 75-86.
W.N. Sharpe, et al. “Tensile testing of MEMS materials-recent progress”. Journal of Materials Science 38 (2003), pp. 4075-4079.
T.E. Buchheit, et al., “Micromechanical testing of MEMS materials”, Journal of Materials Science 38 (2003), pp. 4081-4086.
S.M. Allameh, et al., “An introduction to mechanical- properties-related issues in MEMS structures”, Journal of Materials Science 38 (2003), pp. 4115-4123.
S.M. Allameh, et al., Surface topography evolution and fatigue fracture of polysilicon, Journal of Materials Science 38 (2003), pp. 4145-4155.
Ken Gall, et al., “Thermomechanical response of bare and Al2O3—nanocoated Au/Si bilayer beams for micromechanical systems” , J. Mater. Res., vol. 18, No. 7, Jul. 2003, pp. 1575-1587.

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