Method and apparatus for characterization of devices and...

Details Method and apparatus for characterization of devices and... Method and apparatus for characterization of devices and...

2007-07-31

2007-07-31

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Determination of inherent thermal property

C374S112000, C374S044000, C374S032000

Reexamination Certificate

active

11119093

ABSTRACT:
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.

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