Thermal measuring and testing – Determination of inherent thermal property
Reexamination Certificate
2005-07-26
2005-07-26
Gutierrez, Diego (Department: 2859)
Thermal measuring and testing
Determination of inherent thermal property
C374S032000, C374S045000
Reexamination Certificate
active
06921195
ABSTRACT:
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
REFERENCES:
patent: 4555764 (1985-11-01), Kuehn
patent: 5678924 (1997-10-01), Naquin et al.
patent: 5743641 (1998-04-01), Geiger
patent: 5940784 (1999-08-01), El-Husayni
patent: 5994154 (1999-11-01), Morikawa
patent: 5997174 (1999-12-01), Wyland
patent: 6101200 (2000-08-01), Burbridge et al.
patent: 6203191 (2001-03-01), Mongan
patent: 6367970 (2002-04-01), Danielson
patent: 6491426 (2002-12-01), Schonath et al.
patent: 6748129 (2004-06-01), Braun et al.
patent: 2003/0012252 (2003-01-01), Bender
patent: 19829716 (2000-01-01), None
patent: 1085624 (2001-03-01), None
patent: 2218566 (1989-11-01), None
patent: 60046431 (1985-03-01), None
patent: 63028083 (1999-02-01), None
Pipe et al.: “Comprehensive Heat Exchange Model for a Semiconductor Laser Diode,” IEEE Photonics Technology Letters; vol. 15, No. 4, Apr. 2003; XP-002279368; pp. 504-506.
PCT Search Report: PCT/US03/04089 dated May 26, 2004.
Pipe Kevin P.
Ram Rajeev J.
Daly, Crowley & Mofford & Durkee, LLP
Gutierrez Diego
Jagan Mirellys
Massachusetts Institute of Technology
LandOfFree
Method and apparatus for characterization of devices and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for characterization of devices and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for characterization of devices and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3423212