Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1992-05-01
1994-02-22
Raevis, Robert
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
7386252, 177164, 324605, G01L 126
Patent
active
052877485
ABSTRACT:
A method of changing the sensitivity of a transducer includes applying to the transducer a cyclic excitation signal. The excitation signal has a number of recurring phases of different amplitudes. The transducer's output signal has a like number of recurring phases, each of which corresponds to a phase of the excitation signal. One of the phases of the output signal is selected for data acquisition. Selection of a different phase changes the effective measuring range of the transducer. Preferably, the excitation signal is an a.c. signal, and the output signal is partially demodulated as part of the selection of a phase for data acquisition.
REFERENCES:
patent: 2924967 (1960-02-01), Gieseler
patent: 3437160 (1969-04-01), Hill
patent: 4316518 (1982-02-01), Jonath
patent: 4375243 (1983-03-01), Doll
patent: 4417631 (1983-11-01), Johnson
patent: 4632198 (1986-12-01), Uchimura
patent: 4690230 (1987-09-01), Uchimura et al.
patent: 4722406 (1988-02-01), Naito
patent: 4778016 (1988-10-01), Uchimura
patent: 4981187 (1991-01-01), Masuyama et al.
patent: 5088330 (1992-02-01), Talmadge
2 Articles; Crystal Semiconductor Conductor, dated May 1989 and Jul. 1991.
Pitney Bowes Inc.
Raevis Robert
Scolnick Melvin J.
Whisker Robert H.
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