Method and apparatus for case-based learning

Data processing: artificial intelligence – Knowledge processing system – Knowledge representation and reasoning technique

Reexamination Certificate

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C706S012000, C706S014000

Reexamination Certificate

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10666765

ABSTRACT:
The following techniques for word-level networks are presented: constraints solving, case-based learning and bit-slice solving. Generation of a word-level network to model a constraints problem is presented. The networks utilized have assigned, to each node, a range of permissible values.Constraints are solved using an implication process that explores the deductive consequences of the assigned range values.The implication process may include the following techniques: forward or backward implication and case-based learning. Case-based learning includes recursive or global learning.As part of a constraint-solving process, a random variable is limited to a single value. The limitation may be performed by iterative relaxation. An implication process is then performed. If a conflict results, the value causing the conflict is removed from the random variable by range splitting, and backtracking is performed by assigning another value to the random variable.A procedure is provided for efficiently solving bit-slice operators.

REFERENCES:
patent: 5987443 (1999-11-01), Nichols et al.
patent: 6247002 (2001-06-01), Steels
patent: 2003/0126104 (2003-07-01), Evans-Beauchamp et al.
patent: 2004/0128388 (2004-07-01), Kaiser
A. Chandra et al, AVPGEN—A Test Generator for Architecture Verification, 1995, IEEE, 1063-8210/95, 188-200.
A. Aharon, A. Bar-David, B. Dorfman, E. Gofman, M. Leibowitz, and V. Schwartzburd, “Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-Random Test Program Generator”, IBM Systems Journal, vol. 30, No. 4, 1991, pp. 527-538.
E. Bin, R. Emek, G. Shurek, and A. Ziv, “Using a Constraint Satisfaction Formulation and Solution Techniques for Random Test Program Generation”, IBM Systems Journal, vol. 41, No. 3, 2002, pp. 386-400.
A. K. Chandra and V. S. Iyengar, “Constraint Solving for Test Case Generation”, Proceedings of International Conference on Computer Design, 1992, pp. 245-248.
A. K. Chandra, V. S. Iyengar, D. Jameson, R. Jawalekar, I. Nair, B. Rosen, M. Mullen, J. Yoon, R. Armoni, D. Geist, and Y. Wolfsthal, “AVPGEN—A Test Case Generator for Architecture Verification”, IEEE Transactions on VLSI Systems, vol. 3, No. 2, Jun. 1995, pp. 188-200.
C.-Y. Huang and K.-T. Cheng, “Assertion Checking by Combined Word-level ATPG and Modular Arithmetic Constraint-Solving Techniques”, Proceedings of the Design Automation Conference, Jun. 2000.
M. A. Iyer, “High Time for High-Level ATPG”, Panel position statement, Proceedings of the International Test Conference, 1999, pp. 1112.
W. Kunz, and D. Pradhan, “Recursive Learning: A New Implication Technique for Efficient Solutions to CAD-problems—Test, Verification and Optimization”, IEEE Transactions on Computer-Aided Design, vol. 13, No. 9, Sep. 1994, pp. 1143-1158.
I. Yuan, K. Shultz, C. Pixley, H. Miller, and A. Aziz, “Modeling Design Constraints and Biasing in Simulation Using BDDs”, Proceedings of the International Conference on Computer-Aided Design, Nov. 1999, pp. 584-589.

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