Method and apparatus for calibration of indirect measurement...

Details Method and apparatus for calibration of indirect measurement... Method and apparatus for calibration of indirect measurement...

2006-09-19

2006-09-19

Ho, Allen C. (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

C378S056000, C250S252100

Reexamination Certificate

active

07108424

ABSTRACT:
A calibration technique is presented for calibrating non-reference indirect measurement systems with respect to a reference indirect measurement system. A reference map function filling procedure fits a reference map function based on known values of a parameter of interest associated with reference calibration samples and corresponding reference values associated with the reference calibration samples. A correction function fining procedure fits a correction function based on reference values for calibration samples measured on or simulated for the reference indirect measurement system and corresponding values measured on the non-reference indirect measurement system. During normal use, the non-reference indirect measurement system obtains measurements, corrects the measurements using the correction function, and estimates the parameter of interest of the object of interest using the reference map function based on the corrected measurements.

REFERENCES:
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patent: 6201850 (2001-03-01), Heumann
patent: 6347131 (2002-02-01), Gusterson
patent: 6848827 (2005-02-01), Wu et al.
patent: 2002/0095087 (2002-07-01), Mourad et al.
George W. Snedecor and William G. Cochran. Statistical Methods, eighth edition (Ames, Iowa: Iowa State University Press, 1989), p. 398-419.

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