Oscillators – With frequency calibration or testing
Reexamination Certificate
2007-07-31
2007-07-31
Pascal, Robert (Department: 2817)
Oscillators
With frequency calibration or testing
C331S074000, C331S175000
Reexamination Certificate
active
10865110
ABSTRACT:
Method and apparatus for calibration of a low frequency oscillator in a processor based system. A method for calibrating an on-chip non-precision oscillator. An on-chip precision oscillator is provided having a known frequency of operation that is within an acceptable operating tolerance. The on-chip precision oscillator is used as a time base and then the period of the on-chip oscillator is measured as a function of the time base. The difference between the measured frequency of the on-chip non-precision oscillator and a desired operating frequency of the on-chip non-precision oscillator is then determined. After the difference is determined, the frequency of the on-chip non-precision oscillator is adjusted to minimize the determined difference.
REFERENCES:
patent: 5243302 (1993-09-01), Camp et al.
patent: 5525936 (1996-06-01), Post et al.
patent: 5767747 (1998-06-01), Pricer
patent: 6545550 (2003-04-01), Frerking
Fernald Kenneth W.
Highley Paul
Wilson Brent
Goodley James
Howison & Arnott , L.L.P.
Pascal Robert
Silicon Labs CP Inc.
LandOfFree
Method and apparatus for calibration of a low frequency... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for calibration of a low frequency..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for calibration of a low frequency... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3759646