Data processing: measuring – calibrating – or testing – Testing system
Patent
1997-07-30
1998-12-01
Barlow, Jr., John E.
Data processing: measuring, calibrating, or testing
Testing system
702 57, 702 90, 702117, 364488, 364489, 364490, 364491, 364578, G01C 2500
Patent
active
058452338
ABSTRACT:
A method for calibrating a circuit analyzer includes determining a plurality of initial technology parameters characterizing the circuit according to a timing model of the circuit. A delay along an entire logic path of the circuit is expressed as a function of the technology parameters. A benchmark set of circuit paths is determined which has fixed topology, device sizes, and wire capacitances. The technology parameters are then optimized to minimize error over the set of circuit paths to obtain optimized parameters for use in the timing model. The optimized technology parameters minimize the average error for the benchmark set of paths relative to SPICE or physical measurements. Average error is significantly reduced on a representative set of paths when compared to the conventional approach of separately measuring each parameter.
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Barlow Jr. John E.
Lucent Technologies - Inc.
Vo Hien
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