Method and apparatus for calibrating Reseau grids

Optics: measuring and testing – Refraction testing – Prism engaging specimen

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Details

33125C, 73 1R, 356169, 356172, G01B 1114

Patent

active

039828379

ABSTRACT:
Apparatus and method for calibrating the points in a large Reseau grid with extreme accuracy. The method includes superimposing a smaller calibrated master grid on the large grid, comparing the location of the point on the large grid with the location of the corresponding point on the master grid, generating the comparison data, translating the master grid to another location, comparing the points on the two grids, and repeating the translating and comparing steps until the entire large grid is calibrated. A laser interferometer is used to determine the amount of translation of the master grid with the requisite accuracy.

REFERENCES:
patent: 3551055 (1970-12-01), Chitayat
patent: 3560093 (1971-02-01), Montone
patent: 3621582 (1971-11-01), Radencic
patent: 3632215 (1972-01-01), Holtz

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