Method and apparatus for calibrating piezoelectric driver in...

Details Method and apparatus for calibrating piezoelectric driver in... Method and apparatus for calibrating piezoelectric driver in...

2005-12-13

2005-12-13

Le, N. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S727000, C360S292000, C702S085000

Reexamination Certificate

active

06975123

ABSTRACT:
A method and apparatus are disclosed which are operable to determine a capacitance associated with at least one piezoelectric element in an dual actuator disk drive. The capacitance information is used to adjust a driver used to drive the piezoelectric element. Capacitance is determined by supplying a predetermined current into the piezoelectric element(s) for a predetermined time period. A voltage associated with the piezoelectric element(s) is measured following the predetermined time period. The capacitance of the piezoelectric element(s) is then calculated based on the measured voltage, the current supplied, and the predetermined time period.

REFERENCES:
patent: 4514773 (1985-04-01), Susz

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