Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-07-05
2011-07-05
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S750300
Reexamination Certificate
active
07973549
ABSTRACT:
A method and circuit for measuring internal pulses includes an enable circuit configured to receive a control signal from an on-chip built-in tester to enable measurement of internal circuits. A delay chain is configured to receive a pulse signal from an on-chip circuit component. Sampling latches each include a data input coupled between adjacent delay elements of the delay chain and synchronized with the clock signal such that a transition in the pulse signal is indicated by comparing adjacent digital values in an output sequence.
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Batson Kevin A.
Franch Robert L.
Houle Robert Maurice
Joshi Rajiv V.
International Business Machines - Corporation
Nguyen Ha Tran T
Tutunjian & Bitetto PC
Vazquez Arleen M
Verminski, Esq. Brian P.
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