Method and apparatus for calibrating detector spectral response

Details Method and apparatus for calibrating detector spectral response Method and apparatus for calibrating detector spectral response

2005-02-01

2005-02-01

Church, Craig E. (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

C378S019000

Reexamination Certificate

active

06848827

ABSTRACT:
The present technique provides for the spectral calibration of the detector elements of a CT detector using one or more offset calibration phantoms. The offset phantoms provide greater coverage of the detector elements as well as spectral response data associated with penetration lengths ranging in length from a minimum chord of the phantom to the diameter of the phantom. The spectral response as a function of penetration length can be obtained for each detector element by comparing the fitting of each projection view to the corresponding measured projection view over all view angles. The fitting information may then be employed to derive the coefficients of the spectral response curve for each detector element, which may in turn be employed to provide rapid correction of the spectral response for each element.

REFERENCES:
patent: 4897788 (1990-01-01), King
patent: 5214578 (1993-05-01), Cornuejols et al.
patent: 5774519 (1998-06-01), Lindstrom et al.

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