Method and apparatus for calibrating delay lines

Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S107000, C327S158000

Reexamination Certificate

active

11170207

ABSTRACT:
A delay line (DL) circuit used to generate test pattern waveforms has a pulse generating circuit that is used during calibration to generate a pulse signal upon receiving a signal edge. A delay line of the DL circuit receives the pulse signal and delays the pulse signal by a selected time delay. A feedback loop of the DL circuit feeds the delayed pulse signal output from the delay line back to the input of the pulse generating circuit. Receipt of an edge of the fed back pulse signal at the input of the pulse generating circuit causes the pulse generating circuit to generate another pulse signal. The delayed pulse signal output from the delay line can be input to a counter that generates a counter value that is based on the period of oscillation of the delayed pulse signal.

REFERENCES:
patent: 4497056 (1985-01-01), Sugamori
patent: 4504749 (1985-03-01), Yoshida
patent: 5237224 (1993-08-01), DeLisle et al.
patent: 5245231 (1993-09-01), Kocis et al.
patent: 5703515 (1997-12-01), Toyama et al.
patent: 5712582 (1998-01-01), Yokota et al.
patent: 6100733 (2000-08-01), Dortu et al.
patent: 6105157 (2000-08-01), Miller
patent: 6392466 (2002-05-01), Fletcher
patent: 6642760 (2003-11-01), Alon et al.
patent: 6750688 (2004-06-01), Takai
patent: 2004/0091075 (2004-05-01), Bhullar et al.
patent: 2005/0024107 (2005-02-01), Takai et al.
patent: 0671688 (1998-08-01), None
Search Report dated Sep. 22, 2006, for the patent application in Great Britain No. 0612119.8.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for calibrating delay lines does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for calibrating delay lines, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for calibrating delay lines will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3838386

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.