Method and apparatus for calibrating delay lines

Details Method and apparatus for calibrating delay lines Method and apparatus for calibrating delay lines

2007-08-07

2007-08-07

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Timing

C702S107000, C327S158000

Reexamination Certificate

active

11170207

ABSTRACT:
A delay line (DL) circuit used to generate test pattern waveforms has a pulse generating circuit that is used during calibration to generate a pulse signal upon receiving a signal edge. A delay line of the DL circuit receives the pulse signal and delays the pulse signal by a selected time delay. A feedback loop of the DL circuit feeds the delayed pulse signal output from the delay line back to the input of the pulse generating circuit. Receipt of an edge of the fed back pulse signal at the input of the pulse generating circuit causes the pulse generating circuit to generate another pulse signal. The delayed pulse signal output from the delay line can be input to a counter that generates a counter value that is based on the period of oscillation of the delayed pulse signal.

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Search Report dated Sep. 22, 2006, for the patent application in Great Britain No. 0612119.8.

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