Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1988-03-07
1989-09-19
McGraw, Vincent P.
Optics: measuring and testing
By polarized light examination
With light attenuation
356243, G01B 1100
Patent
active
048675660
ABSTRACT:
A novel method and apparatus for determining the accuracy of artwork produced from a laser direct imaging system employs a calibration substrate which has images of opposed, perpendicular scales and registration marks thereon. The overall system dimensional error is determined directly from substrate measurements, as is the magnitude of the mechanical and processing errors.
REFERENCES:
patent: 4639142 (1987-01-01), Chow et al.
Straayer Ronald J.
Timmons, Jr. Raymond E.
McGraw Vincent P.
The Gerber Scientific Instrument Company
Turner S. A.
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