Optics: measuring and testing – Standard
Patent
1998-10-28
2000-04-25
Hantis, K. P.
Optics: measuring and testing
Standard
G01J 110
Patent
active
06055049&
ABSTRACT:
Prior art methods calibrate the travel path and/or the angular position of holding devices in equipment for manufacturing electrical assemblies by optical measurements of the position of simulations of electrical components that are equipped on a calibration substrate. Markings on the simulations and local reference marks on the calibration substrate serve this purpose. Printed circuit board cameras that are utilized as optical sensors exhibit a pronounced camera distortion that makes the calibration more difficult. As a result of the method, the apparatus as well as the calibration substrate, a sensor correction factor is determined in that the position of two correction marks that are applied on the calibration substrate at a predetermined nominal spacing and a predetermined position relative to one another are measured with the printed circuit board camera. The result of the measurement is compared to the nominal spacing.
REFERENCES:
patent: 4055376 (1977-10-01), Daberko
patent: 5537204 (1996-07-01), Woodhouse
Hantis K. P.
Siemens Aktiengesellschaft
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