Thermal measuring and testing – Thermal calibration system
Reexamination Certificate
2011-03-08
2011-03-08
Caputo, Lisa M (Department: 2855)
Thermal measuring and testing
Thermal calibration system
C374S183000
Reexamination Certificate
active
07901130
ABSTRACT:
The presently described embodiments are directed to a calibration method and system for thin film thermistors that are locally heated with integrated thin film heaters. Initially, print head temperature is either measured or referenced. Then, transient thermistor resistances are measured and used to determine the thermistor resistance at a higher temperature. Notably, this calibration method is advantageously implemented as a step of an existing process without having to expose the print heads to operating temperatures. In some implementations of the presently described embodiments, trimming of the thermistors may be required once calibrated.
REFERENCES:
patent: 3759083 (1973-09-01), Erickson et al.
patent: 4059982 (1977-11-01), Bowman
patent: 5075690 (1991-12-01), Kneezel
patent: 5315316 (1994-05-01), Khormaee
patent: 5406315 (1995-04-01), Allen et al.
patent: 5406361 (1995-04-01), Kim
patent: 5428206 (1995-06-01), Uchida et al.
patent: 5485182 (1996-01-01), Takayanagi et al.
patent: 5528276 (1996-06-01), Katsuma
patent: 5576745 (1996-11-01), Matsubara
patent: 5585825 (1996-12-01), Kneezel et al.
patent: 5696543 (1997-12-01), Koizumi et al.
patent: 5745130 (1998-04-01), Becerra et al.
patent: 5881451 (1999-03-01), Kneezel et al.
patent: 6024430 (2000-02-01), Koitabashi et al.
patent: 6139125 (2000-10-01), Otsuka et al.
patent: 6299273 (2001-10-01), Anderson et al.
patent: 6302507 (2001-10-01), Prakash et al.
patent: 6302509 (2001-10-01), Iwasaki et al.
patent: 6601941 (2003-08-01), Jones et al.
patent: 6641243 (2003-11-01), Anderson et al.
patent: 6708279 (2004-03-01), Takenaka
patent: 2003/0033055 (2003-02-01), McRae et al.
patent: 2005/0093910 (2005-05-01), Im
patent: 2006/0170735 (2006-08-01), Hong et al.
patent: 19017 (1980-11-01), None
patent: 03272854 (1991-12-01), None
Limb Scott Jong Ho
Littau Karl A.
Young Michael Yu Tak
Caputo Lisa M
Fay Sharpe LLP
Jagan Mirellys
Palo Alto Research Center Incorporated
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