Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate
2005-02-01
2005-02-01
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Sensor or transducer
C702S097000, C356S237200, C356S401000, C356S328000, C324S765010, C430S022000, C430S030000, C257S005000, C703S013000, C716S030000
Reexamination Certificate
active
06850858
ABSTRACT:
A method and apparatus for calibrating a metrology tool are disclosed. The method includes measuring a parameter of a contrast enhanced feature on an artifact using a metrology tool, where the contrast enhanced feature reduces random errors in the metrology tool during the measuring process. The measured parameter is compared with an initial parameter associated with the artifact and the metrology tool is adjusted until the measured parameter matches the initial parameter.
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Hughes Gregory P.
Ibsen Kent B.
West Craig A.
Baker & Botts L.L.P.
Bhat Aditya
DuPont Photomasks, Inc.
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