Method and apparatus for calibrating a lightwave component measu

Optics: measuring and testing – For optical fiber or waveguide inspection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356243, G01N 2100

Patent

active

049213474

ABSTRACT:
A method and apparatus for calibrating absolute and relative measurements of modulation and/or demodulation transfer characteristics of electro-optical and opto-electrical devices during setup of a lightwave component measurement system for characterizing performance of fiber optic systems and associated components. The lightwave component measurement system calibrated in accordance with the method of the invention provides the capability to measure the optical, electrical, and, especially, the electro-optical (E/O) and opto-electrical (O/E) components with specified measurement performance. In accordance with the calibration method of the invention, when the lightwave component measurement system is used to characterize an E/O or O/E device, an initial calibration reference is established based on the known characteristics of a lightwave source and lightwave receiver included in the lightwave component measurement system. A measurement is then performed on the calibration reference (the lightwave source or the lightwave receiver), and error correction data are produced and stored in a lightwave component analyzer included in the lightwave component measurement system. The modulation (or demodulation) transfer characteristics are preferably given in terms of the responsivity magnitude and phase versus modulation frequency. A device under test (DUT) then is measured when it replaces its calibrated counterpart in the measurement setup. The lightwave component analyzer uses the error correction data when the E/O or O/E characteristics of the DUT are measured.

REFERENCES:
patent: 4703433 (1987-10-01), Sharrit
"Frequency Domain Optical Reflectometer", MacDonald, Applied Optics, 5-1981, pp. 1840-1844.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for calibrating a lightwave component measu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for calibrating a lightwave component measu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for calibrating a lightwave component measu will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-826220

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.