Method and apparatus for calibrating a frequency domain...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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C324S601000

Reexamination Certificate

active

11110264

ABSTRACT:
A calibration system is provided for calibrating frequency domain reflectometers in the field by using both the scattering parameters of the multi-port junction determined at the factory and changing the offset and gain terms used in generating a complex reflection coefficient by using internal calibrated loads so that heavy, cumbersome external calibrated transmission lines are not required. In one embodiment the internal calibrated loads include RLC circuits and in another embodiment the internal calibrated loads include attenuators. Further, retesting or recalibration does not necessitate reconnecting the cable under test, which may remain connected to the reflectometer's test port throughout the procedure.

REFERENCES:
patent: 4630228 (1986-12-01), Tarczy-Hornoch et al.
patent: 5068614 (1991-11-01), Fields et al.
patent: RE35561 (1997-07-01), Mashikian et al.
patent: 5949236 (1999-09-01), Franchville
patent: 5994905 (1999-11-01), Franchville
patent: 6417674 (2002-07-01), Rowell et al.
PCT International Search Report dated Mar. 29, 2006 of International Application No. PCT/US05/01799 filed Jan. 13, 2005, all pages.

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