Data processing: measuring – calibrating – or testing – Calibration or correction system
Reexamination Certificate
2006-07-11
2006-07-11
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
C702S064000, C702S107000, C324S601000, C341S126000, C341S120000, C341S118000, C341S145000
Reexamination Certificate
active
07076384
ABSTRACT:
A method and apparatus for calibrating a current source to a reference current through the use of 1-bit current comparisons. A temporary current source is first calibrated to the reference current, which allows an input offset current generated by the current comparator to be memorized. The current to be calibrated is then fine-tuned to the temporary current within specified limits, which effectively cancels comparison error that is generated by the input offset current.
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Radulov, G. I. et al.; “A Calibration Algorithm for Current-Steering DACs with Relaxed Design Requirments,” available from Xilinx, Inc., 2100 Logic Drive, San Jose, CA 95124.
Radulov, G. I. et al.; “A Self-Calibrating Current-Steering 12-Bit DAC Based On New 1-Bit Self-Test Scheme”, available from Xilinx, Inc., 2100 Logic Drive, San Jose, CA 95124.
Hegt Johannes A.
Quinn Patrick J.
Radulov Georgi I
van Roermund Arthur H. M.
Barlow John
Liu Justin
Maunu LeRoy D.
Vo Hien
Xilinx , Inc.
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