Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2006-03-14
2006-03-14
Picard, Leo (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S019000, C716S030000, C716S030000
Reexamination Certificate
active
07013253
ABSTRACT:
A method and apparatus for identifying potential noise failures in an integrated circuit design is described. In one embodiment, the method comprises locating a victim net and an aggressor within the integrated circuit design, modeling the victim net using two π-type resistor-capacitor (RC) circuits, including determining a coupling between the victim net and the aggressor, and indicating that the integrated circuit design requires modification if modeling the victim net indicates that a potential noise failure may occur in the integrated circuit design.
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Cong Jingsheng Jason
Pan Zhigang David
Srinivas Prasanna V.
Blakely , Sokoloff, Taylor & Zafman LLP
Magma Design Automation Inc.
Picard Leo
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